Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies

Published 2007 View Full Article

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Title
Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies
Authors
Keywords
-
Journal
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
Volume 269, Issue 1-2, Pages 112-117
Publisher
Elsevier BV
Online
2007-10-06
DOI
10.1016/j.ijms.2007.09.018

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