Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies

出版年份 2007 全文链接

标题

作者

关键词

出版物

Volume 269, Issue 1-2, Pages 112-117

出版商

Elsevier BV

发表日期

2007-10-06

DOI

10.1016/j.ijms.2007.09.018

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