Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs

Published 2015 View Full Article

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Title
Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs
Authors
Keywords
Gate insulator, GaN, MIS-HEMTs, Trapping effects
Journal
MICROELECTRONICS RELIABILITY
Volume 55, Issue 9-10, Pages 1692-1696
Publisher
Elsevier BV
Online
2015-08-02
DOI
10.1016/j.microrel.2015.06.130

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