Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits

Published 2015 View Full Article

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Title
Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits
Authors
Keywords
BTI, Operating temperature, Workload, Lifetime estimation
Journal
MICROELECTRONICS RELIABILITY
Volume 55, Issue 8, Pages 1152-1162
Publisher
Elsevier BV
Online
2015-07-05
DOI
10.1016/j.microrel.2015.06.004

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