Mutation-Driven Generation of Unit Tests and Oracles

Published 2011 View Full Article

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Title
Mutation-Driven Generation of Unit Tests and Oracles
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING
Volume 38, Issue 2, Pages 278-292
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-09-23
DOI
10.1109/tse.2011.93
References
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