An Analysis and Survey of the Development of Mutation Testing

Published 2010 View Full Article

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Title
An Analysis and Survey of the Development of Mutation Testing
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING
Volume 37, Issue 5, Pages 649-678
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-06-24
DOI
10.1109/tse.2010.62

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