Approximate Reliability Function Based on Wavelet Latin Hypercube Sampling and Bee Recurrent Neural Network

Title
Approximate Reliability Function Based on Wavelet Latin Hypercube Sampling and Bee Recurrent Neural Network
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON RELIABILITY
Volume 60, Issue 2, Pages 404-414
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-04-13
DOI
10.1109/tr.2011.2134190

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