Approximate Reliability Function Based on Wavelet Latin Hypercube Sampling and Bee Recurrent Neural Network

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 60, Issue 2, Pages 404-414

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2011-04-13

DOI

10.1109/tr.2011.2134190

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