Reliability Analysis and Comparison of Implication and Reprogrammable Logic Gates in Magnetic Tunnel Junction Logic Circuits

Title
Reliability Analysis and Comparison of Implication and Reprogrammable Logic Gates in Magnetic Tunnel Junction Logic Circuits
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON MAGNETICS
Volume 49, Issue 12, Pages 5620-5628
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-12-04
DOI
10.1109/tmag.2013.2278683

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