Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking

Published 2013 View Full Article

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Title
Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking
Authors
Keywords
-
Journal
PROCEEDINGS OF THE IEEE
Volume 101, Issue 12, Pages 2498-2533
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-06-08
DOI
10.1109/jproc.2013.2252317

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