Journal
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
Volume 56, Issue 11, Pages 4465-4472Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIE.2008.928100
Keywords
Design-of-experiments (DOE); photovoltaic (PV) inverters; reliability
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This paper presents a strategy, based on the design-of-experiments technique, aimed at optimizing the reliability in inverters for photovoltaic systems. The process involves designing the inverter several times, each time with different specifications, and calculating the reliability for each design. The specifications are established in a systematic manner, in such a way that the parameters with the highest impact are easily identified. The optimization procedure follows a standard reliability estimation methodology and involves modifying the stress factors in a judicious manner. The strategy is exemplified with an integrated boost inverter and a desired mean time between failures of 12 years.
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