Low-Frequency Noise in Oxide-Based $(\hbox{TiN}/ \hbox{HfO}_{x}/\hbox{Pt})$ Resistive Random Access Memory Cells

Published 2012 View Full Article

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Title
Low-Frequency Noise in Oxide-Based $(\hbox{TiN}/ \hbox{HfO}_{x}/\hbox{Pt})$ Resistive Random Access Memory Cells
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 59, Issue 3, Pages 850-853
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-01-10
DOI
10.1109/ted.2011.2178245
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