The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 58, Issue 11, Pages 3652-3666

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2011-10-05

DOI

10.1109/ted.2011.2164543

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