Sub-$\hbox{100-}\mu\hbox{A}$ Reset Current of Nickel Oxide Resistive Memory Through Control of Filamentary Conductance by Current Limit of MOSFET

Published 2008 View Full Article

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Title
Sub-$\hbox{100-}\mu\hbox{A}$ Reset Current of Nickel Oxide Resistive Memory Through Control of Filamentary Conductance by Current Limit of MOSFET
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 55, Issue 5, Pages 1185-1191
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-04-29
DOI
10.1109/ted.2008.919385

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