Negative-/Positive-Bias-Instability Analysis of the Memory Characteristics Improved by Hydrogen Postannealing in MANOS Capacitors

Published 2009 View Full Article

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Title
Negative-/Positive-Bias-Instability Analysis of the Memory Characteristics Improved by Hydrogen Postannealing in MANOS Capacitors
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume 10, Issue 2, Pages 295-300
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-12-01
DOI
10.1109/tdmr.2009.2036248
References
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