Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs

Authors

Keywords

Journal

Volume 56, Issue 5, Pages 359-363

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2009-04-29

DOI

10.1109/tcsii.2009.2019164

Discuss science. Find collaborators. Network.

Join a conversation

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started