Error-Related EEG Potentials Generated During Simulated Brain–Computer Interaction

Title
Error-Related EEG Potentials Generated During Simulated Brain–Computer Interaction
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING
Volume 55, Issue 3, Pages 923-929
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-02-22
DOI
10.1109/tbme.2007.908083

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