High-Speed Oxide Confined 850-nm VCSELs Operating Error-Free at 40 Gb/s up to 85$^{\circ}{\rm C}$

Title
High-Speed Oxide Confined 850-nm VCSELs Operating Error-Free at 40 Gb/s up to 85$^{\circ}{\rm C}$
Authors
Keywords
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Journal
IEEE PHOTONICS TECHNOLOGY LETTERS
Volume 25, Issue 8, Pages 768-771
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-03-30
DOI
10.1109/lpt.2013.2250946

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