Engineering Oxygen Vacancy of Tunnel Barrier and Switching Layer for Both Selectivity and Reliability of Selector-Less ReRAM

Published 2014 View Full Article

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Title
Engineering Oxygen Vacancy of Tunnel Barrier and Switching Layer for Both Selectivity and Reliability of Selector-Less ReRAM
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 35, Issue 10, Pages 1022-1024
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-09-09
DOI
10.1109/led.2014.2347925

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