Diode-MTJ Crossbar Memory Cell Using Voltage-Induced Unipolar Switching for High-Density MRAM

Title
Diode-MTJ Crossbar Memory Cell Using Voltage-Induced Unipolar Switching for High-Density MRAM
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 34, Issue 6, Pages 753-755
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-05-04
DOI
10.1109/led.2013.2255096

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started