Bias-Stress-Induced Instabilities in P-Type ${\rm Cu}_{2}{\rm O}$ Thin-Film Transistors

Published 2013 View Full Article

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Title
Bias-Stress-Induced Instabilities in P-Type ${\rm Cu}_{2}{\rm O}$ Thin-Film Transistors
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 34, Issue 5, Pages 647-649
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-04-16
DOI
10.1109/led.2013.2253758

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