Modeling the Impact of Reset Depth on Vacancy-Induced Filament Perturbations in ${\rm HfO}_{2}$ RRAM

Published 2013 View Full Article

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Title
Modeling the Impact of Reset Depth on Vacancy-Induced Filament Perturbations in ${\rm HfO}_{2}$ RRAM
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 34, Issue 5, Pages 614-616
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-04-16
DOI
10.1109/led.2013.2254462

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