Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-$k$ Dielectric/Metal Gate

Published 2011 View Full Article

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Title
Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-$k$ Dielectric/Metal Gate
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 32, Issue 5, Pages 686-688
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-03-22
DOI
10.1109/led.2011.2114633

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