Effect of Scaling $\hbox{WO}_{x}$-Based RRAMs on Their Resistive Switching Characteristics

Title
Effect of Scaling $\hbox{WO}_{x}$-Based RRAMs on Their Resistive Switching Characteristics
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 32, Issue 5, Pages 671-673
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-03-18
DOI
10.1109/led.2011.2114320

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started