Full-Wafer Characterization of AlGaN/GaN HEMTs on Free-Standing CVD Diamond Substrates

Published 2009 View Full Article

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Title
Full-Wafer Characterization of AlGaN/GaN HEMTs on Free-Standing CVD Diamond Substrates
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 2, Pages 99-101
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-12-17
DOI
10.1109/led.2009.2036574
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