A Robust Data Retention Characteristic of Sol–Gel-Derived Nanocrystal Memory by Hot-Hole Trapping

Published 2010 View Full Article

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Title
A Robust Data Retention Characteristic of Sol–Gel-Derived Nanocrystal Memory by Hot-Hole Trapping
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 7, Pages 746-748
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-05-27
DOI
10.1109/led.2010.2048193
References
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