High Performance and Stability of Double-Gate Hf–In–Zn–O Thin-Film Transistors Under Illumination

Title
High Performance and Stability of Double-Gate Hf–In–Zn–O Thin-Film Transistors Under Illumination
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 9, Pages 960-962
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-07-20
DOI
10.1109/led.2010.2051407

Ask authors/readers for more resources

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started