Improvement of CBRAM Resistance Window by Scaling Down Electrode Size in Pure-GeTe Film

Title
Improvement of CBRAM Resistance Window by Scaling Down Electrode Size in Pure-GeTe Film
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 30, Issue 2, Pages 120-122
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-01-06
DOI
10.1109/led.2008.2009774

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