Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs

Published 2009 View Full Article

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Title
Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 30, Issue 6, Pages 672-674
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-05-27
DOI
10.1109/led.2009.2020069

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