A New Technique to Extract the Source/Drain Series Resistance of MOSFETs

Title
A New Technique to Extract the Source/Drain Series Resistance of MOSFETs
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 30, Issue 9, Pages 975-977
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-08-05
DOI
10.1109/led.2009.2026592

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