Dynamic Resistance—A Metric for Variability Characterization of Phase-Change Memory

Published 2009 View Full Article

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Title
Dynamic Resistance—A Metric for Variability Characterization of Phase-Change Memory
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 30, Issue 2, Pages 126-129
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-01-06
DOI
10.1109/led.2008.2010004

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