Operational Voltage Reduction of Flash Memory Using High-$\kappa$ Composite Tunnel Barriers

Published 2008 View Full Article

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Title
Operational Voltage Reduction of Flash Memory Using High-$\kappa$ Composite Tunnel Barriers
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 29, Issue 3, Pages 252-254
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-03-01
DOI
10.1109/led.2007.915376

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