Determination of High-Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity by Kelvin Probe Force Microscopy

Title
Determination of High-Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity by Kelvin Probe Force Microscopy
Authors
Keywords
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Journal
LANGMUIR
Volume 31, Issue 41, Pages 11339-11343
Publisher
American Chemical Society (ACS)
Online
2015-09-23
DOI
10.1021/acs.langmuir.5b01786

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