Effect of chemical mechanical treatment on the optoelectronic properties in CMOS image sensor

Numerical Analysis of Buffer-Trap Effects on Gate Lag in AlGaN/GaN High Electron Mobility Transistors

(2013) Atsushi Nakajima et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Effect of Alkaline pH on Polishing and Etching of Single and Polycrystalline Silicon

(2013) R. Prasanna Venkatesh et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Low-Shrinkage Spin-On Glass for Low Parasitic Capacitance Gap-Filling Process in Advanced Memory Devices

(2013) Daisuke Ryuzaki et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Fast Response Variable Focal-Length Lenses Using KTa1-xNbxO3Crystals

(2011) Tadayuki Imai et al.   Applied Physics Express

Determination of the Expanded Optical Transfer Function in Saturated Excitation Imaging and High Harmonic Demodulation

(2011) Shogo Kawano et al.   Applied Physics Express

Polarization Analyzing Image Sensor with On-Chip Metal Wire Grid Polarizer in 65-nm Standard Complementary Metal Oxide Semiconductor Process

(2011) Sanshiro Shishido et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Relationship between Resolution, Line Edge Roughness, and Sensitivity in Chemically Amplified Resist of Post-Optical Lithography Revealed by Monte Carlo and Dissolution Simulations

(2009) Akinori Saeki et al.   Applied Physics Express

Sensitivity and crosstalk study of the zero gap microlens used in 3.2μm active pixel image sensors

(2009) Xiangliang Jin et al.   MICROELECTRONIC ENGINEERING