标题
Reliable high-yield CNTFET-based 9T SRAM operating near threshold voltage region
作者
关键词
Carbon nanoelectronics, CNTFET technology, High yield, Near threshold voltage, Probability of functionality
出版物
Journal of Computational Electronics
Volume 17, Issue 2, Pages 774-783
出版商
Springer Nature
发表日期
2018-02-02
DOI
10.1007/s10825-017-1127-z
参考文献
相关参考文献
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