Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy
出版年份 2016 全文链接
标题
Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 119, Issue 8, Pages 084304
出版商
AIP Publishing
发表日期
2016-02-26
DOI
10.1063/1.4941697
参考文献
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