Experiments and simulation of the secondary effect during focused Ga ion beam induced deposition of adjacent nanostructures

标题
Experiments and simulation of the secondary effect during focused Ga ion beam induced deposition of adjacent nanostructures
作者
关键词
Secondary effect, Secondary particle, Numerical model, Structural characterization, Composition content, Adjacent nanostructures
出版物
MATERIALS & DESIGN
Volume 209, Issue -, Pages 109993
出版商
Elsevier BV
发表日期
2021-07-17
DOI
10.1016/j.matdes.2021.109993

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started