Quantifying non-centrosymmetric orthorhombic phase fraction in 10 nm ferroelectric Hf0.5Zr0.5O2 films
出版年份 2020 全文链接
标题
Quantifying non-centrosymmetric orthorhombic phase fraction in 10 nm ferroelectric Hf0.5Zr0.5O2 films
作者
关键词
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出版物
APPLIED PHYSICS LETTERS
Volume 117, Issue 26, Pages 262905
出版商
AIP Publishing
发表日期
2020-12-29
DOI
10.1063/5.0029611
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi Diffraction
- (2020) Maximilian Lederer et al. Nanomaterials
- Phase-Exchange-Driven Wake-Up and Fatigue in Ferroelectric Hafnium Zirconium Oxide Films
- (2020) Shelby S. Fields et al. ACS Applied Materials & Interfaces
- Enhanced ferroelectricity in ultrathin films grown directly on silicon
- (2020) Suraj S. Cheema et al. NATURE
- A critical review of recent progress on negative capacitance field-effect transistors
- (2019) Muhammad A. Alam et al. APPLIED PHYSICS LETTERS
- Nanoscale resistive switching memory devices: a review
- (2019) Stefan Slesazeck et al. NANOTECHNOLOGY
- Crystal Phase Distribution and Ferroelectricity in Ultrathin HfO 2 –ZrO 2 Bilayers
- (2019) Martin E. McBriarty et al. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS
- Local structural investigation of hafnia-zirconia polymorphs in powders and thin films by X-ray absorption spectroscopy
- (2019) Tony Schenk et al. ACTA MATERIALIA
- Iron Vacancies Accommodate Uranyl Incorporation into Hematite
- (2018) Martin E. McBriarty et al. ENVIRONMENTAL SCIENCE & TECHNOLOGY
- Ferroelectric hafnium oxide for ferroelectric random-access memories and ferroelectric field-effect transistors
- (2018) Thomas Mikolajick et al. MRS BULLETIN
- Atomic Structure of Domain and Interphase Boundaries in Ferroelectric HfO2
- (2018) Everett D. Grimley et al. Advanced Materials Interfaces
- Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment
- (2017) Min Hyuk Park et al. Nanoscale
- A comprehensive study on the structural evolution of HfO2 thin films doped with various dopants
- (2017) M. H. Park et al. Journal of Materials Chemistry C
- On the structural origins of ferroelectricity in HfO2 thin films
- (2015) Xiahan Sang et al. APPLIED PHYSICS LETTERS
- The origin of ferroelectricity in Hf1−xZrxO2: A computational investigation and a surface energy model
- (2015) R. Materlik et al. JOURNAL OF APPLIED PHYSICS
- The effects of crystallographic orientation and strain of thin Hf0.5Zr0.5O2 film on its ferroelectricity
- (2014) Min Hyuk Park et al. APPLIED PHYSICS LETTERS
- Quantitatively Probing the Al Distribution in Zeolites
- (2014) Aleksei Vjunov et al. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
- Zr-induced structural changes in Hf1−x Zr x O2 high-k thin films
- (2013) M. A. Sahiner et al. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
- Phase transitions in ferroelectric silicon doped hafnium oxide
- (2011) T. S. Böscke et al. APPLIED PHYSICS LETTERS
- Ferroelectric Zr0.5Hf0.5O2thin films for nonvolatile memory applications
- (2011) J. Müller et al. APPLIED PHYSICS LETTERS
- VESTA 3for three-dimensional visualization of crystal, volumetric and morphology data
- (2011) Koichi Momma et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Structural properties and electronic structure ofHfO2-ZrO2composite films
- (2010) Deok-Yong Cho et al. PHYSICAL REVIEW B
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