Prediction of critical undeformed chip thickness for ductile mode to brittle transition in the cutting of single-crystal silicon

标题
Prediction of critical undeformed chip thickness for ductile mode to brittle transition in the cutting of single-crystal silicon
作者
关键词
-
出版物
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 35, Issue 9, Pages 095010
出版商
IOP Publishing
发表日期
2020-06-12
DOI
10.1088/1361-6641/ab9bee

向作者/读者发起求助以获取更多资源

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started