标题
Fidelity benchmarks for two-qubit gates in silicon
作者
关键词
-
出版物
NATURE
Volume 569, Issue 7757, Pages 532-536
出版商
Springer Science and Business Media LLC
发表日期
2019-05-14
DOI
10.1038/s41586-019-1197-0
参考文献
相关参考文献
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