Experimental fault-tolerant universal quantum gates with solid-state spins under ambient conditions

标题
Experimental fault-tolerant universal quantum gates with solid-state spins under ambient conditions
作者
关键词
-
出版物
Nature Communications
Volume 6, Issue 1, Pages -
出版商
Springer Nature
发表日期
2015-11-25
DOI
10.1038/ncomms9748

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