Local electrical characterization of two-dimensional materials with functional atomic force microscopy
出版年份 2019 全文链接
标题
Local electrical characterization of two-dimensional materials with functional atomic force microscopy
作者
关键词
advanced AFM techniques, nanoscale characterization, electrical properties, 2D materials
出版物
Frontiers of Physics
Volume 14, Issue 3, Pages -
出版商
Springer Nature
发表日期
2019-01-28
DOI
10.1007/s11467-018-0879-7
参考文献
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