Nanoscale microwave microscopy using shielded cantilever probes

Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization

(2011) Lan Zhang et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Cryogenic microwave imaging of metal–insulator transition in doped silicon

(2011) Worasom Kundhikanjana et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Ultrathin Topological Insulator Bi2Se3Nanoribbons Exfoliated by Atomic Force Microscopy

(2010) Seung Sae Hong et al.   NANO LETTERS

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

(2010) H. P. Huber et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Mesoscopic Percolating Resistance Network in a Strained Manganite Thin Film

(2010) K. Lai et al.   SCIENCE

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

(2009) Harutyun Melikyan et al.   JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS

Nanoscale Electronic Inhomogeneity in In2Se3Nanoribbons Revealed by Microwave Impedance Microscopy

(2009) Keji Lai et al.   NANO LETTERS

Hierarchy of Electronic Properties of Chemically Derived and Pristine Graphene Probed by Microwave Imaging

(2009) Worasom Kundhikanjana et al.   NANO LETTERS

Tapping mode microwave impedance microscopy

(2009) K. Lai et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Calibration of shielded microwave probes using bulk dielectrics

(2008) K. Lai et al.   APPLIED PHYSICS LETTERS

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement

(2008) A. Karbassi et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope

(2008) K. Lai et al.   REVIEW OF SCIENTIFIC INSTRUMENTS