Gwyddion: an open-source software for SPM data analysis

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Methods for determining and processing 3D errors and uncertainties for AFM data analysis

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Local probe microscopy with interferometric monitoring of the stage nanopositioning

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Design of a large measurement-volume metrological atomic force microscope (AFM)

(2009) Brian J Eves   MEASUREMENT SCIENCE and TECHNOLOGY

Atomic and subnanometer resolution in ambient conditions by atomic force microscopy

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Dynamic light scattering and atomic force microscopy techniques for size determination of polyurethane nanoparticles

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