Local probe microscopy with interferometric monitoring of the stage nanopositioning

标题
Local probe microscopy with interferometric monitoring of the stage nanopositioning
作者
关键词
-
出版物
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 20, Issue 8, Pages 084007
出版商
IOP Publishing
发表日期
2009-07-01
DOI
10.1088/0957-0233/20/8/084007

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now