Design of a large measurement-volume metrological atomic force microscope (AFM)

标题
Design of a large measurement-volume metrological atomic force microscope (AFM)
作者
关键词
-
出版物
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 20, Issue 8, Pages 084003
出版商
IOP Publishing
发表日期
2009-07-01
DOI
10.1088/0957-0233/20/8/084003

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started