Uniformity and passivation research of Al2O3 film on silicon substrate prepared by plasma-enhanced atom layer deposition

标题
Uniformity and passivation research of Al2O3 film on silicon substrate prepared by plasma-enhanced atom layer deposition
作者
关键词
PEALD, Al<sub>2</sub>O<sub>3</sub>, Silicon surface passivation, Uniformity
出版物
Nanoscale Research Letters
Volume 10, Issue 1, Pages -
出版商
Springer Nature
发表日期
2015-03-12
DOI
10.1186/s11671-015-0831-5

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