Journal
GEOSTANDARDS AND GEOANALYTICAL RESEARCH
Volume 33, Issue 3, Pages 309-317Publisher
WILEY-BLACKWELL
DOI: 10.1111/j.1751-908X.2009.00024.x
Keywords
selenium; NIST SRM; reference materials; MPI-DING; LA-ICP-MS; SHRIMP; EMPA; BCR-2G; selenium; NIST SRM; materiaux de reference; MPI-DING; LA-ICP-MS; SHRIMP; EMPA; BCR-2G
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Funding
- Australian Research Council
- JAM
- RJA
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A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 +/- 2 mu g g-1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 +/- 0.2 mu g g-1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 +/- 0.012 mu g g-1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 mu g g-1. Selenium in the natural glass, VG2, was 0.204 +/- 0.028 mu g g-1.
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