High-Resolution Mapping of Complex Traits with a Four-Parent Advanced Intercross Yeast Population

Title
High-Resolution Mapping of Complex Traits with a Four-Parent Advanced Intercross Yeast Population
Authors
Keywords
-
Journal
GENETICS
Volume 195, Issue 3, Pages 1141-1155
Publisher
Genetics Society of America
Online
2013-09-14
DOI
10.1534/genetics.113.155515

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now