High-Throughput Discovery of Mutations in Tef Semi-Dwarfing Genes by Next-Generation Sequencing Analysis

Title
High-Throughput Discovery of Mutations in Tef Semi-Dwarfing Genes by Next-Generation Sequencing Analysis
Authors
Keywords
-
Journal
GENETICS
Volume 192, Issue 3, Pages 819-829
Publisher
Genetics Society of America
Online
2012-08-19
DOI
10.1534/genetics.112.144436

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